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Publications by Beth Cook
Integration of IC Industry Feature Sizes With University Back-End-Of-Line Post Processing: Example Using a Phase-Change Memory Test Chip
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On-Chip Photonic Memory Elements Employing Phase-Change Materials
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Feature Integration Using a Feature Construct
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Phase Noise Measurement Using a High Resolution Counter With On-Line Data Processing
IC Immunity Modeling Process Validation Using On-Chip Measurements
Translation of Automotive Module RF Immunity Test Limits Into Equivalent IC Test Limits Using S-Parameter IC Models
Evaluating Feature Change Impact on Multi-Product Line Configurations Using Partial Information
Lecture Notes in Computer Science
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Open Business Models: A Case Study of System-On-A-Chip (SoC) Design Foundry in the Integrated Circuit (IC) Industry
African Journal of Business Management
