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Publications by Bruno M. Kalab
Damage Characterization of Semiconductor Devices for the AN/TRC-145 EMP Study
Related publications
Characterization of Enhanced Conductivity Dielectrics for Use in Semiconductor Devices.
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SIAM Journal on Applied Mathematics
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Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
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Study of Interface Charge Densities for ZrO2and HfO2Based Metal-Oxide-Semiconductor Devices
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Basics of Semiconductor Devices
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The Review of Laser Engineering
