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Publications by C. P. Ravikumar
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Distributed Fault Simulation Algorithms on Parallel Virtual Machine
VLSI Design
Electronic Engineering
Computer Graphics
Hardware
Electrical
Architecture
Computer-Aided Design
