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Publications by C.T. Schamp

STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging at ≤ 30 kV With No Aberration Correction for Nanomaterials on Graphene Support

Microscopy and Microanalysis
Instrumentation
2016English

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Chromatic Aberration Correction for Atomic Resolution TEM Imaging From 20 to 80 kV

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Atomic-Resolution EELS in Aberration-Corrected STEM

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2003English

Free-Standing Graphene at Atomic Resolution

Nature Nanotechnology
Electronic EngineeringCondensed Matter PhysicsMaterials ScienceOpticsMolecular Physics,NanoscienceElectricalAtomicBioengineeringNanotechnologyBiomedical Engineering
2008English

Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

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2013English

STEM Aberration Correction: Where Next?

Microscopy and Microanalysis
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2002English

Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15-30 kV) With Monochromator

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3D Atom Probe: Chemical Analysis With (Near) Atomic Resolution

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2003English

Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Microscopy and Microanalysis
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2017English

Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Microscopy and Microanalysis
Instrumentation
2014English

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