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Publications by Camelia Hora
Gate Leakage Impact on Full Open Defects in Interconnect Lines
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hardware
Electronic Engineering
Electrical
Architecture
Software
Related publications
Diagnosis of Full Open Defects in Interconnecting Lines
25th IEEE VLSI Test Symmposium (VTS'07)
Localization and Electrical Characterization of Interconnect Open Defects
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Simulation of Lithography-Caused Gate Length and Interconnect Linewidth Variational Impact on Circuit Performance in Nanoscale Semiconductor Manufacturing
Effects of Substrate Defects on the Gate Leakage Current of AlGaN/GaN Heterojunction FETs Fabricated on Na Flux Bulk GaN
On the Link Between Electroluminescence, Gate Current Leakage, and Surface Defects in AlGaN/GaN High Electron Mobility Transistors Upon Off-State Stress
Applied Physics Letters
Astronomy
Physics
Design Techniques for Gate-Leakage Reduction in CMOS Circuits
Pulse Sequences for Suppressing Leakage in Single-Qubit Gate Operations
Physical Review B
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
