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Publications by Ching Chun Lin

Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

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Analysis of Nanostructures With Scanning Transmission Electron Microscopy

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Crystal Structure Analysis Using Scanning Transmission Electron Microscopy

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Analysis of Crystal Defects by Scanning Transmission Electron Microscopy (STEM) in a Modern Scanning Electron Microscope

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Defect Characterization Using Transmission Scanning Electron Microscopy

Microscopy and Microanalysis

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Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy

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Recent Breakthroughs in Scanning Transmission Electron Microscopy of Small Species

Advances in Physics: X

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Manifold Learning of Four-Dimensional Scanning Transmission Electron Microscopy

npj Computational Materials

Mechanics of Materials

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Strain Resolution of Scanning Electron Microscopy Based Kossel Microdiffraction

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CASINO Monte Carlo Simulations of Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

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