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Publications by D. F. Ogletree
The Role of Contaminants in the Variation of Adhesion, Friction, and Electrical Conduction Properties of Carbide-Coated Scanning Probe Tips and Pt(111) in Ultrahigh Vacuum
Journal of Applied Physics
Astronomy
Physics
Influence of Carrier Density on the Friction Properties of Siliconpnjunctions
Physical Review B
Related publications
Electrical Characterization of Metal-Coated Carbon Nanotube Tips
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Micromachined Silicon Cantilevers and Tips for Scanning Probe Microscopy
Microelectronic Engineering
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Optical
Electrical
Atomic
Magnetic Materials
Films
Nanotechnology
Optics
Coatings
The Role of Molecular State and Orientation in Harpooning Reactions:N2Oon Cs/Pt(111)
Physical Review Letters
Astronomy
Physics
Layer-Dependent Nanoscale Electrical Properties of Graphene Studied by Conductive Scanning Probe Microscopy
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Mechanical and Electrical Properties of ZnO-Nanowire/Si-Substrate Junctions Studied by Scanning Probe Microscopy
Acta Physica Polonica A
Astronomy
Physics
Single-Nanoparticle-Terminated Tips for Scanning Probe Microscopy
Carbon-Fiber Tips for Scanning Probe Microscopes and Molecular Electronics Experiments
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Fabrication of Nano-Tips by Carbon Contamination in a Scanning Electron Microscope for Use in Scanning Probe Microscopy and Field Emission
Microscopy Microanalysis Microstructures
