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Publications by D. Flatoff
Low Damage Sample Preparation of Semiconductor Materials Using Low Energy Ion Milling
Microscopy and Microanalysis
Instrumentation
Related publications
In-Situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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Surface Investigations of Selected Materials by Low-Energy Ion Scattering Technique
Acta Physica Polonica A
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Streamlining Sample Preparation of Semiconductor Materials With a New Site-Specific Cleaving Technology
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Investigating Mechanisms of Radiation-Induced DNA Damage Using Low-Energy Photons
Acta Physica Polonica A
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Surface Preparation of Uranium by Ion Milling
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Kaufman-Type Low-Energy Ion Source.
SHINKU
Velocity Scaling of Ion Neutralization in Low Energy Ion Scattering
Physical Review Letters
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Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy
Microscopy and Microanalysis
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Low Temperature Fabrication of AlN Film by Irradiation of Low Energy Ion Beam.
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Mechanical Engineering
