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Publications by D. Hawthorn
Aberration Corrected STEM-EELS Study of the Hole Distribution in Cuprate Superconductors
Microscopy and Microanalysis
Instrumentation
Related publications
Atomic-Resolution EELS in Aberration-Corrected STEM
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Instrumentation
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS
Microscopy and Microanalysis
Instrumentation
The Ultimate Resolution in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Surface Channeling in Aberration-Corrected STEM of Nanostructures
Microscopy and Microanalysis
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Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
Understanding Catalyst Stability Through Aberration-Corrected STEM
Microscopy and Microanalysis
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
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Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate
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Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts
Microscopy and Microanalysis
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