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Publications by D.R.T. Zahn

Spectroscopic Ellipsometry Studies and Temperature Behaviour of the Dielectric Function of TlInS2 Layered Crystal

Journal of Nano- and Electronic Physics

Materials Science

Condensed Matter Physics

English

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Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.

English

In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes

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Studies of Thin Strained InAs, AlAs, and AlSb Layers by Spectroscopic Ellipsometry

Journal of Applied Physics

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Determination of Complex Dielectric Functions of Ion Implanted and Implanted‐annealed Amorphous Silicon by Spectroscopic Ellipsometry

Journal of Applied Physics

English

Fundamentals and Applications of Spectroscopic Ellipsometry

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Morphology and Spectroscopic Ellipsometry of PMMA Thin Films

Applied Physics Research

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Characterizing Temperature-Dependent Optical Properties of (MA0.13FA0.87) PbI3 Single Crystals Using Spectroscopic Ellipsometry

Scientific Reports

Multidisciplinary

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Anharmonic Line Shift and Linewidth of the Raman Modes in TlInS2 Layered Crystals

Journal of Raman Spectroscopy

Materials Science

English

Dielectric Properties of Lignin and Glucomannan as Determined by Spectroscopic Ellipsometry and Lifshitz Estimates of Non-Retarded Hamaker Constants

English