Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Delu Liu
Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Related publications
How to Resolveab-Initionanostructures by Electron Diffraction: Applications of Beam Precession in Transmission Electron Microscopy
Acta Crystallographica Section A Foundations of Crystallography
Transmission Electron Microscopy
Springer Series in Optical Sciences
Optical
Electronic
Magnetic Materials
Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Analysis of Nanostructures With Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Analytical Transmission Electron Microscopy
Reviews in Mineralogy and Geochemistry
Petrology
Geochemistry
Recent Progress in Materials Analysis by Transmission Electron Microscopy
Materials Transactions, JIM
Crystal Structure Analysis Using Scanning Transmission Electron Microscopy
Nihon Kessho Gakkaishi
High-Resolution Transmission Electron Microscopy.
Hyomen Kagaku
Reducing Electron Beam Damage With Multipass Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
