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Publications by E. A. Delenia
TEM and Atom Probe Microscopy in the Development of Magnetic Multilayer Nano-Structures
Microscopy and Microanalysis
Instrumentation
Related publications
An Fim-Atom Probe and Tem Study of Alnico Permanent Magnetic Material
Le Journal de Physique Colloques
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
Scanning Probe Microscopy in TEM : An In-Situ Approach for Nano-Scale Property Measurements
Microscopy and Microanalysis
Instrumentation
Development of the Scanning Atom Probe
Microscopy and Microanalysis
Instrumentation
Correlation Between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification
Microscopy and Microanalysis
Instrumentation
Atom-Probe Tomography of Semiconductor Materials and Device Structures
MRS Bulletin
Materials Science
Theoretical Chemistry
Condensed Matter Physics
Physical
Magnetic Induction Mapping in TEM of Micro- And Nano-Patterned Co/Ni Arrays
Microscopy and Microanalysis
Instrumentation
Monte Carlo Simulation of Aging Phenomena in Multilayer Magnetic Structures
EPJ Web of Conferences
Astronomy
Physics
