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Publications by E. C. Young
Critical Thickness for the Formation of Misfit Dislocations Originating From Prismatic Slip in Semipolar and Nonpolar III-nitride Heterostructures
APL Materials
Materials Science
Engineering
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Critical Thickness for Interface Misfit Dislocation Formation in Two-Dimensional Materials
Physical Review B
Optical
Electronic
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Erratum: Misfit Dislocations and Critical Thickness of Heteroepitaxy [J. Appl. Phys.69, 7901 (1991)]
Journal of Applied Physics
Astronomy
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Theoretical Consideration of Equilibrium Dissociation Geometries of 60° Misfit Dislocations in Single Semiconductor Heterostructures
Journal of Applied Physics
Astronomy
Physics
A Decade of Nonpolar and Semipolar III-Nitrides: A Review of Successes and Challenges
Physica Status Solidi (A) Applications and Materials Science
Surfaces
Electronic Engineering
Condensed Matter Physics
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Optical
Electrical
Magnetic Materials
Films
Coatings
Electronic
Interfaces
The Surface and Interface Nucleation of Misfit Dislocations as a Possible Source of Asymmetric Strain Relaxation in Vicinal Heterostructures
Czechoslovak Journal of Physics
Astronomy
Physics
Growth, Properties, and Device Applications of III-Nitride Nanowire Heterostructures
A Mechanism for the Introduction of Threading Dislocations in III-nitride Epitaxial Layers From Closed Basal Stacking Fault Domains
Spatial Distribution of Composition and Misfit Dislocations on the Surface of Alloys
Semiconductor Science and Technology
Electronic Engineering
Condensed Matter Physics
Optical
Materials Chemistry
Electrical
Magnetic Materials
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Misfit Strain Relaxation by Dislocations in SrRuO3/SrTiO3 (001) Heteroepitaxy
Journal of Applied Physics
Astronomy
Physics