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Publications by E. Murakami
Special Features in Stress Degradation of SiC-MOSFETs Observed in I-V Characteristics
Formation of High Quality Si1-xGex/Si Crystals Heterostructure Limited Area MBE Growth
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A Surface-Potential-Based Analytical I-V Model of Full-Depletion Single-Gate SOI MOSFETs
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Effect of Gate-Field Dependent Mobility Degradation on Distortion Analysis in MOSFETs
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