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Publications by E. Voelkl
Live Measurement of Electrical Charge Density in Materials Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Off-Axis Electron and Light Optical Holograms: How They Process and How They Compare
Microscopy and Microanalysis
Instrumentation
Related publications
Model-Based Iterative Reconstruction of Charge Density in Nanoscale Materials Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Measuring Surface Charge on a Single Nanoparticle in Liquids Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Direct Measurement of Barrier Asymmetry inAlOx∕ZrOymagnetic Tunnel Junctions Using Off-Axis Electron Holography
Physical Review B
Magnetic Imaging of Skyrmions in FeGe Using Off-Axis Electron Holography
Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Exploring CCD Camera Parameters With Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Study of Magnetic Domain Structure in Co(Fe)/Pd Multilayers Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Prospects for Off-Axis Electron Holography in the TEAM I Microscope
Microscopy and Microanalysis
Instrumentation
