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Publications by Eiji Sonezaki
Radiation Hardness Evaluations of 65 Nm Fully Depleted Silicon on Insulator and Bulk Processes by Measuring Single Event Transient Pulse Widths and Single Event Upset Rates
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Related publications
Heavy-Ion Induced Single Event Upsets in Advanced 65 Nm Radiation Hardened FPGAs
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Single-Event Upset Effects in Optocouplers
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Investigation of Heavy-Ion Induced Single-Event Transient in 28 Nm Bulk Inverter Chain
Symmetry
Mathematics
Chemistry
Physics
Computer Science
Astronomy
Single Event Upset: An Embedded Tutorial
Measurements and Simulations of Single-Event Upsets in a 28-Nm FPGA
Calculated Pulse Widths and Spectra of a Single Sonoluminescing Bubble
Science
Multidisciplinary
Philosophy of Science
History
Single-Event Latchup Modeling Based on Coupled Physical and Electrical Transient Simulations in CMOS Technology
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Single Event Transient Effects on 3T and 4T CMOS Active Pixel Sensors for Different Technologies
Australian Journal of Electrical and Electronics Engineering
Electronic Engineering
Electrical
Recent Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics
