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Publications by G.P. Vella-Coleiro
Fully Ion-Implanted InP JFET With Buried P-Layer
IEEE Electron Device Letters
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
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Emission Channeling Studies of Implanted 167mEr in InP
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Reliability of Buried InGaAs Channel N-MOSFETs With an InP Barrier Layer and Al2O3 Dielectric Under Positive Bias Temperature Instability Stress
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The Nature and Habit Planes of Defects in P+ Ion-Implanted Silicon
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Ion Pairs Buried in Hydrophobic Environments Within Proteins: Electrostatic Crosstalk Between Buried Groups
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