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Publications by Geoff N Pain
X-Ray Diffraction Investigation of Epitaxial Layers of CdTe on Sapphire
Australian Journal of Physics
Related publications
Sapphire by Combined Electron and X-Ray Diffraction
Acta Crystallographica Section A Foundations of Crystallography
Investigation of Damaged Layer Formed at Mechanical Treatment of Sapphire Using Three-Crystal X-Ray Diffraction Method
Functional Materials
Materials Science
Using Synchrotron Radiation X‐ray Multiple Diffraction to Examine the Lattice Coherency of Semiconductor Surfaces and Epitaxial Layers
Journal of Applied Physics
Astronomy
Physics
Diffuse X-Ray Scattering From Defects in GaN Epitaxial Layers
Acta Crystallographica Section A Foundations of Crystallography
Erratum: X‐Ray Diffraction Investigation of Β′‐NiAl Alloys
Journal of Applied Physics
Astronomy
Physics
X-Ray Diffraction Method for Determination of Texture Evolution in Layers
Textures and Microstructures
Investigation of AlGaN Buffer Layers on Sapphire Grown by MOVPE
Synchrotron Topography and X-Ray Diffraction Study of GaInP Layers Grown on GaAs/Ge
Journal of Crystal Growth
Inorganic Chemistry
Materials Chemistry
Condensed Matter Physics
X-Ray Response of Epitaxial GaAs
Journal of Applied Physics
Astronomy
Physics
