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Publications by H-J Kang
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
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Avoiding the Curtaining Effect: Backside Milling by FIB INLO
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Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM With FIB: A Method Capable of Re-Thinning After TEM Observation
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Comparison of Fib Tem Specimen Preparation Methods
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Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
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Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;
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Planarization Processes for Pre-Fib Sample Preparation
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