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Publications by Heather A. Holdaway
Sample Preparation Induced Artifacts in Cryo-Electron Tomographs
Microscopy and Microanalysis
Instrumentation
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Removing Contamination-Induced Reconstruction Artifacts From Cryo-Electron Tomograms
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Miniaturized Sample Preparation for Transmission Electron Microscopy
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GraFix: Sample Preparation for Single-Particle Electron Cryomicroscopy
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Advances in Sample Preparation of Semiconductor Devices for Electron Microscopy
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A Fully Automated System for the Preparation of Samples for Cryo-Electron Microscopy
Automated, Robotic Preparation of Vitrified Samples for 2D and 3D Cryo Electron Microscopy
Microscopy Today
Site Specific Cryo-Fib Preparations Aimed at in Situ Cryo-Electron Tomography
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