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Publications by Hisaharu Yoshida
EDX Analysis of Low Concentration Dopant Using HD-2700 Aberration Corrected STEM Equipped With Dual SDD
Microscopy and Microanalysis
Instrumentation
Related publications
Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
The Ultimate Resolution in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Atomic-Resolution EELS in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Surface Channeling in Aberration-Corrected STEM of Nanostructures
Microscopy and Microanalysis
Instrumentation
Understanding Catalyst Stability Through Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected HAADF-STEM Investigations of Precipitate Structures in Al–Mg–Si Alloys With Low Cu Additions
Philosophical Magazine
Condensed Matter Physics
Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts
Microscopy and Microanalysis
Instrumentation
