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Publications by Holger JENETT

Effects of Ion Optics on the Sensitivity Factors in Secondary Neutral Mass Spectrometry Measurements.

Analytical Sciences

Analytical Chemistry

English

Related publications

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering

Materials Chemistry

Electrochemistry

English

Secondary Ion Mass Spectrometry (SIMS)

English

20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)

Materials Science

Molecular Biology

English

Borophosphosilicate Glass Component Analysis Using Secondary Neutral Mass Spectrometry

Semiconductor Physics, Quantum Electronics and Optoelectronics

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

Microscopy and Microanalysis

Instrumentation

English

Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry

Surface and Coatings Technology

Condensed Matter Physics

Materials Chemistry

English

Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry

Journal of Research of the National Bureau of Standards

English

Colocalization of the Ganglioside GM1and Cholesterol Detected by Secondary Ion Mass Spectrometry

Journal of the American Chemical Society

Surface Chemistry

English

Secondary Ion Mass Spectrometry Study of Erbium Titanium Codiffusion in Lithium Niobate

IEEE Photonics Technology Letters

Electronic Engineering

Molecular Physics,

Magnetic Materials

English