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Publications by Hung-Wei Li

Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors Under Hot-Carrier Stress

Journal of the Electrochemical Society

Condensed Matter Physics

Electrochemistry

Materials Chemistry

Magnetic Materials

Renewable Energy

the Environment

English

Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors

ECS Journal of Solid State Science and Technology

Magnetic Materials

English

Related publications

Width Dependent Electrically Stress Degradation of Bottom Gate Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

English

Instability of Amorphous-Indium Gallium Zinc Oxide (A-Igzo) Thin Film Transistors Under DC and AC Bias Stress

English

Nitrocellulose-Based Collodion Gate Insulator for Amorphous Indium Zinc Gallium Oxide Thin-Film Transistors

Journal of Information Display

Electronic Engineering

Materials Science

English

Novel Passivation Layer for Improvement of Reliability in Amorphous Indium Gallium Zinc Oxide Thin Film Transistors (TFTs)

English

Effective Density-Of-States Distribution of Polycrystalline Silicon Thin-Film Transistors Under Hot-Carrier Degradation

Journal of Applied Physics

English

Spatially and Temporally Resolving the Degradation of N-Channel Poly-Si Thin-Film Transistors Under Hot-Carrier Stressing

Journal of Applied Physics

English

Operational Stability of Solution Based Zinc Tin Oxide/SiO2 Thin Film Transistors Under Gate Bias Stress

Materials Science

English

Mechanical Properties of Amorphous Indium–gallium–zinc Oxide Thin Films on Compliant Substrates for Flexible Optoelectronic Devices

Thin Solid Films

Materials Chemistry

Magnetic Materials

English