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Publications by I. Geltner
Characterization of the Electrical Properties and Thickness of Thin Epitaxial Semiconductor Layers by THz Reflection Spectroscopy
Journal of Applied Physics
Astronomy
Physics
Detection and Electrical Characterization of Hidden Layers Using Time-Domain Analysis of Terahertz Reflections
Journal of Applied Physics
Astronomy
Physics
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Characterization of Epitaxial Semiconductor Layers Using Terahertz Time-Domain Spectroscopy
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Electrical Characterization of Conducting Polypyrrole by THz Time-Domain Spectroscopy
Applied Physics Letters
Astronomy
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Epitaxial Growth and Electrical Transport Properties of Cr2GeC Thin Films
Physical Review B
Influence of the Electrical Conductivity on Magnetic Properties of CdZnMnTe Epitaxial Layers
Preparation and Electrical Properties of Vapor Grown InP and In1-xGaxP Epitaxial Layers
IEEJ Transactions on Fundamentals and Materials
Electronic Engineering
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Accuracy and Resolution of THz Reflection Spectroscopy for Medical Imaging
Physics in Medicine and Biology
Radiological
Radiology
Nuclear Medicine
Ultrasound Technology
Imaging
The Electrical, Optical, and Structural Properties of GaN Epitaxial Layers Grown on Si(111) Substrate With Interlayers
Superlattices and Microstructures
Electronic Engineering
Electrical
Condensed Matter Physics
Materials Science
Growth and Characterization of Epitaxial Piezoelectric and Semiconductor Films.
Optimization and Characterization of NiO Thin Film and the Influence of Thickness on the Electrical Properties of N-ZnO Nanorods/P-NiO Heterojunction
Semiconductor Science and Technology
Electronic Engineering
Condensed Matter Physics
Optical
Materials Chemistry
Electrical
Magnetic Materials
Electronic
