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Publications by J. Antonio del Río
Role of an Oxidant Mixture as Surface Modifier of Porous Silicon Microstructures Evaluated by Spectroscopic Ellipsometry
Scientific Reports
Multidisciplinary
Related publications
Non-Destructive Characterization of Nitrogen-Implanted Silicon-On-Insulator Structures by Spectroscopic Ellipsometry
Materials Science & Engineering B: Solid-State Materials for Advanced Technology
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Determination of Complex Dielectric Functions of Ion Implanted and Implanted‐annealed Amorphous Silicon by Spectroscopic Ellipsometry
Journal of Applied Physics
Astronomy
Physics
Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Effects of Porous Surface Layer on Lubrication Evaluated by Ring Compression Friction Test
ISIJ International
Mechanics of Materials
Alloys
Materials Chemistry
Metals
Mechanical Engineering
Structure-Cytotoxicity Relationship of Methacrylate-Based Resin Monomers as Evaluated by an Anti-Oxidant Responsive Element-Luciferase Reporter Assay
Dental Materials Journal
Composites
Dentistry
Ceramics
Fundamentals and Applications of Spectroscopic Ellipsometry
Quimica Nova
Chemistry
Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry
Applied Physics Letters
Astronomy
Physics
New Features of the Layer‐by‐layer Deposition of Microcrystalline Silicon Films Revealed by Spectroscopic Ellipsometry and High Resolution Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
