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Publications by J. C. H. Spence
Real Space Charge Density Mapping by Quantitative Convergent Beam Electron Diffraction (QCBED)
Acta Crystallographica Section A Foundations of Crystallography
Tomographic Diffractive Imaging. STEM Lithography for Nanorings
Microscopy and Microanalysis
Instrumentation
Related publications
Quantitative Convergent Beam Electron Diffraction
Materials Transactions, JIM
Quantitative Convergent Beam Electron Diffraction
Microscopy and Microanalysis
Instrumentation
Refinement of Crystal Structural Parameters and Charge Density Using Convergent-Beam Electron Diffraction
Microscopy and Microanalysis
Instrumentation
Nano Structures Studied by Convergent Beam Electron Diffraction
Acta Crystallographica Section A Foundations of Crystallography
Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles
Microscopy and Microanalysis
Instrumentation
Symmetry Study of PbZr1−xTixO3by Convergent-Beam Electron Diffraction
Acta Crystallographica Section A Foundations of Crystallography
Locating Atoms in Small Crystals by Combining Convergent Beam Electron Diffraction and Electron Channeling
Microscopy and Microanalysis
Instrumentation
Profiling Strain in Thin Buried Layers by Convergent-Beam Electron-Diffraction Techniques
Acta Crystallographica Section A Foundations of Crystallography
