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Publications by J. Gyulai
Non-Destructive Characterization of Nitrogen-Implanted Silicon-On-Insulator Structures by Spectroscopic Ellipsometry
Materials Science & Engineering B: Solid-State Materials for Advanced Technology
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Kinetics of TiSi2formation by Thin Ti Films on Si
Journal of Applied Physics
Astronomy
Physics
Related publications
Determination of Complex Dielectric Functions of Ion Implanted and Implanted‐annealed Amorphous Silicon by Spectroscopic Ellipsometry
Journal of Applied Physics
Astronomy
Physics
Strained Silicon-On-Insulator - Fabrication and Characterization
Characterization of the SEI on a Carbon Film Electrode by Combined EQCM and Spectroscopic Ellipsometry
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Role of an Oxidant Mixture as Surface Modifier of Porous Silicon Microstructures Evaluated by Spectroscopic Ellipsometry
Scientific Reports
Multidisciplinary
Non-Destructive Test of Steel Structures by Conical Indentation
MATEC Web of Conferences
Materials Science
Engineering
Chemistry
Applications of Subwavelength Grating Structures in Silicon-On-Insulator Waveguides
Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Imaging by Silicon on Insulator Waveguides
Applied Physics Letters
Astronomy
Physics
Experimental Investigation of Self-Assembled Opal Structures by Atomic Force Microscopy, Spectroscopic Ellipsometry and Reflectometry
Journal of Self-Assembly and Molecular Electronics (SAME)
