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Publications by J. K. Farrer
EBSD Pattern Collection and Orientation Mapping at Normal Incidence to the Electron Beam
Microscopy and Microanalysis
Instrumentation
Related publications
Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)
IEEE Transactions on Magnetics
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Ion Imaging in a Focused Ion Beam Microscope: Modeling the Channeling Contrast to Construct EBSD-like Orientation Maps
Improving the Accuracy of Orientation Measurements Using EBSD
Microscopy and Microanalysis
Instrumentation
Alternatives to Image Quality (IQ) Mapping in EBSD
Microscopy and Microanalysis
Instrumentation
Tin Whiskers: Electron Microscopy and EBSD Characterization
Microscopy and Microanalysis
Instrumentation
EBSD Analysis of Orientation Gradients Developed Near Grain Boundaries
Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Geological Sample Preparation Evaluations by EBSD Pattern Quality
Microscopy and Microanalysis
Instrumentation
The Crystal Ball and Taps Detectors at the Mami Electron Beam Facility
“Normal” Orientation Distributions
Textures and Microstructures
