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Publications by J. Moers
Scanning Spreading Resistance Microscopy of Two-Dimensional Diffusion of Boron Implanted in Free-Standing Silicon Nanostructures
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Related publications
Two-Dimensional Profiling of Carriers in a Buried Heterostructure Multi-Quantum-Well Laser: Calibrated Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Raman Spectroscopy and Spreading Resistance Analysis of Phosphorus Implanted and Annealed Silicon
Journal of Applied Physics
Astronomy
Physics
Kinetic Roughening of Charge Spreading in a Two-Dimensional Silicon Nanocrystal Network Detected by Electrostatic Force Microscopy
Physical Review B
Electron Microscopy Studies of Ion Implanted Silicon
Free Standing Double Walled Boron Nanotubes
Journal of Physics and Chemistry of Solids
Materials Science
Chemistry
Condensed Matter Physics
Analysis of Nanostructures With Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
1-Nm Spatial Resolution in Carrier Mapping of Ultra-Shallow Junctions by Scanning Spreading Resistance Microscopy
Boron Diffusion in Silicon Oxides and Oxynitrides
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Characterization of Thermal Transport in Low-Dimensional Boron Nitride Nanostructures
Physical Review B
