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Publications by J. Pineda de Gyvez
Course Development in IC Manufacturing
IEEE Transactions on Education
Electronic Engineering
Education
Electrical
IC Defect Sensitivity for Footprint-Type Spot Defects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Functional Testing for Cellular Neural Networks
Electronics Letters
Electronic Engineering
Electrical
Evaluation of Signature-Based Testing of RF/Analog Circuits
An SRAM Weak Cell Fault Model and a DFT Technique With a Programmable Detection Threshold
Threshold Voltage and Power-Supply Tolerance of CMOS Logic Design Families
