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Publications by J. Sagar

Low-Loss Superconducting Nanowire Circuits Using a Neon Focused Ion Beam

Physical Review Applied

English

Progress in a New Method of Thickness Measurement by X-Ray Analysis in TEM

Microscopy and Microanalysis

Instrumentation

English

Related publications

Use of a Focused Ion Beam for Characterizing SIS Circuits

IEEE Transactions on Applied Superconductivity

Electronic Engineering

Condensed Matter Physics

Magnetic Materials

English

Optimized Ordered Nanoprinting Using Focused Ion Beam

Advances in Materials Science and Engineering

English

Focused Ion Beam Tomography

English

Micro-Fabrication of Biodegradable Polymers Using Focused Ion Beam

Journal of Photopolymer Science and Technology

Organic Chemistry

Materials Chemistry

English

A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam

Microscopy and Microanalysis

Instrumentation

English

Fabrication of Small Magnetic Tunnel Junctions Using a Focused Ion Beam

Journal of the Magnetics Society of Japan

English

Dual-Beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

Microscopy and Microanalysis

Instrumentation

English

Three-Dimensional Analysis Using Focused Ion Beam and Electron Microscope

Vacuum and Surface Science

English

X-Ray Diffraction Using Focused-Ion-Beam-Prepared Single Crystals

Journal of Applied Crystallography

Molecular Biology

English