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Publications by J.-L. Putaux

Stress and Strain Around Grain-Boundary Dislocations Measured by High-Resolution Electron Microscopy

Philosophical Magazine

Condensed Matter Physics

English

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Strain Fields Around Dislocation Arrays in a Σ9 Silicon Bicrystal Measured by Scanning Transmission Electron Microscopy

Philosophical Magazine

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Characterization of Grain Structure in Nanocrystalline Gadolinium by High-Resolution Transmission Electron Microscopy

Journal of Materials Research

Mechanics of Materials

Materials Science

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Mechanical Engineering

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The Structure of Grain Boundaries in Rocks Studied by High-Resolution Electron Microscopy.

Nihon Kessho Gakkaishi

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A High-Resolution Electron Microscopy Study of Dislocations in Graphene Nano-Flakes Produced by Chemical Ultrasonic Exfoliation

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Chlorite Examination by Ultramicrotomy and High Resolution Electron Microscopy

Clays and Clay Minerals

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High-Resolution Transmission Electron Microscopy.

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High Resolution Electron Microscopy - Principles and Practice

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Measurement of Charge at Grain-Boundary Edge Dislocations in Ca-Doped and Undoped YBCO by Electron Holography

Microscopy and Microanalysis

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Strain Resolution of Scanning Electron Microscopy Based Kossel Microdiffraction

Journal of Applied Crystallography

Molecular Biology

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