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Publications by J.-P. Banon

Critical Dimension Metrology of a Plasmonic Photonic Crystal Based on Mueller Matrix Ellipsometry and the Reduced Rayleigh Equation

Molecular Physics,

English

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Mueller Matrix Imaging Ellipsometry for Nanostructure Metrology

Molecular Physics,

English

Dispersion of Polarization Coupling, Localized and Collective Plasmon Modes in a Metallic Photonic Crystal Mapped by Mueller Matrix Ellipsometry

Molecular Physics,

English

Ultraviolet–Visible Plasmonic Properties of Gallium Nanoparticles Investigated by Variable-Angle Spectroscopic and Mueller Matrix Ellipsometry

Electronic Engineering

Molecular Physics,

Magnetic Materials

English

Metrology of Nanostructures by Tomographic Mueller-Matrix Scatterometry

Applied Sciences (Switzerland)

Instrumentation

Materials Science

Computer Science Applications

Process Chemistry

Transfer Processes

English

Robust Overlay Metrology With Differential Mueller Matrix Calculus

Molecular Physics,

English

Model-Based Library for Critical Dimension Metrology by CD-SEM

Microscopy and Microanalysis

Instrumentation

English

Plasmonic Gold Nanodiscs Fabricated Into a Photonic-Crystal Nanocavity

Mechanics of Materials

Electronic Engineering

Mechanical Engineering

Materials Science

English

Ultrasensitive Broadband Infrared 4 × 4 Mueller-Matrix Ellipsometry for Studies of Depolarizing and Anisotropic Thin Films

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Electronic Engineering

Condensed Matter Physics

Instrumentation

Materials Chemistry

Magnetic Materials

Process Chemistry

English

Electromagnon Excitation in Cupric Oxide Measured by Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry

Scientific Reports

Multidisciplinary

English