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Publications by J.C. Meyer
Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies
Microscopy and Microanalysis
Instrumentation
Related publications
High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM
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Aberration-Corrected STEM for Elemental Mapping
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Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts
Microscopy and Microanalysis
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
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Chromatic-Aberration-Corrected Diffractive Lenses for Ultra-Broadband Focusing
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The Ultimate Resolution in Aberration-Corrected STEM
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Atomic-Resolution EELS in Aberration-Corrected STEM
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Surface Channeling in Aberration-Corrected STEM of Nanostructures
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Aberration-Corrected ETEM: In-Situ Reduction of Cobalt Oxides
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