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Publications by Jason M. Kephart
Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
Microscopy and Microanalysis
Instrumentation
Related publications
Capability of Insulator Study by Photoemission Electron Microscopy at SPring-8
Journal of Synchrotron Radiation
High Energy Physics
Instrumentation
Radiation
Nuclear
Microstructural Properties and Defect Evolution on Nitride Compound Semiconductors Grown on Patterned Substrates: A Transmission Electron Microscopy Study
Microscopy and Microanalysis
Instrumentation
Energy Filtered X-Ray Photoemission Electron Microscopy
Advances in Imaging and Electron Physics
High Energy Physics
Electronic Engineering
Electrical
Condensed Matter Physics
Nuclear
Atomic Force Microscopy as Analytical Tool to Study Physico-Mechanical Properties of Intestinal Cells
Beilstein Journal of Nanotechnology
Electronic Engineering
Materials Science
Nanoscience
Electrical
Nanotechnology
Astronomy
Physics
Atomic Force Microscopy as Analytical Tool to Study Physico-Mechanical Properties of Intestinal Cells
Direct Imaging of Optical Diffraction in Photoemission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Layer Dependence of the Electronic Band Alignment of Few-Layer MoS2 on SiO2 Measured Using Photoemission Electron Microscopy
Physical Review B
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Foreword for the Special Issue on the Tenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy
Ultramicroscopy
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
Aberration Corrected Photoemission Electron Microscopy With Photonics Applications
