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Publications by Jennifer Regner
Integration of IC Industry Feature Sizes With University Back-End-Of-Line Post Processing: Example Using a Phase-Change Memory Test Chip
Related publications
On-Chip Photonic Memory Elements Employing Phase-Change Materials
Advanced Materials
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Gridpix - Chip Post-Processing
Feature Integration Using a Feature Construct
Science of Computer Programming
Software
Phase Noise Measurement Using a High Resolution Counter With On-Line Data Processing
IC Immunity Modeling Process Validation Using On-Chip Measurements
Translation of Automotive Module RF Immunity Test Limits Into Equivalent IC Test Limits Using S-Parameter IC Models
Evaluating Feature Change Impact on Multi-Product Line Configurations Using Partial Information
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
Optimization of the Phase Change Random Access Memory Employing Phase Change Materials
Open Business Models: A Case Study of System-On-A-Chip (SoC) Design Foundry in the Integrated Circuit (IC) Industry
African Journal of Business Management
