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Publications by Jeremy Kirch
Interfacial Mixing Analysis for Strained Layer Superlattices by Atom Probe Tomography
Crystals
Materials Science
Inorganic Chemistry
Chemical Engineering
Condensed Matter Physics
Related publications
Nanostructure Analysis by Laser Assisted Atom Probe Tomography
Vacuum and Surface Science
Defect States in Type-Ii Strained-Layer Superlattices
Promoting Standards in Quantitative Atom Probe Tomography Analysis
Microscopy and Microanalysis
Instrumentation
Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
New Applications in Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Atom Probe Tomography: A Technique for Nanoscale Characterization
Microscopy and Microanalysis
Instrumentation
An Introduction to Atom Probe Tomography
Microscopy and Microanalysis
Instrumentation
Application of Atom Probe Tomography to the Investigation of Atomic Force Microscope Tips and Interfacial Phenomena
Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
Instrumentation
