Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Juan I. Beltran
High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Related publications
The Ultimate Resolution in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Atomic-Resolution EELS in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts
Microscopy and Microanalysis
Instrumentation
Surface Channeling in Aberration-Corrected STEM of Nanostructures
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM
Microscopy and Microanalysis
Instrumentation
Recent Studies of Oxide-Semiconductor Heterostructures Using Aberration-Corrected Scanning Transmission Electron Microscopy
Journal of Materials Research
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Understanding Catalyst Stability Through Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation