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Publications by K. Danno

LACBED Analysis of Threading Dislocation With C+a Burgers Vector in 4h-SiC

English

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Evolution of Threading Screw Dislocation Conversion During Solution Growth of 4h-SiC

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Torsion and Burgers Vector of a Tube Dislocation

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Evolution of Threading Edge Dislocation During Solution Growth of SiC

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Forward Voltage Degradation of 4h-SiC Pin Diodes and High Voltage 4h-SiC Pin Diodes on the (000-1) C-Face With Reduced Forward Degradation

IEEJ Transactions on Industry Applications

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500$^{\circ}{\rm C}$ Bipolar Integrated OR/NOR Gate in 4h-SiC

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Charge Accumulation at a Threading Edge Dislocation in Gallium Nitride

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Incipient Plasticity in 4h-SiC During Quasistatic Nanoindentation

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Major Deep Levels With the Same Microstructures Observed in N-Type 4H–SiC and 6H–SiC

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Threading Dislocation Reduction in Transit Region of GaN Terahertz Gunn Diodes

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