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Publications by Kenneth M. Butler
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Related publications
A Delay Fault Model for At-Speed Fault Simulation and Test Generation
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
Computer Science Applications
Computer Graphics
Computer-Aided Design
Software
Motion Analysis of a Low Cost Customized A-Scan Non Destructive Testing Unit
MATEC Web of Conferences
Materials Science
Engineering
Chemistry
Low Speed Torsion Fatigue Testing Machines
Transactions of the Japan Society of Mechanical Engineers
Using Fault Injection for Testing Linux Kernel Components
Proceedings of the Institute for System Programming of RAS
Low Cost Fault-Tolerant Routing Algorithm for Networks-On-Chip
Microprocessors and Microsystems
Computer Networks
Hardware
Communications
Architecture
Artificial Intelligence
Software
A Low-Cost Beam-Scanning Second Harmonic Generation Microscope With Application for Agrochemical Development and Testing
Synthesis Methodology for Built-In At-Speed Testing
Use and Acceptability of HIV Self-Testing Among First-Time Testers at Risk for HIV in Senegal
AIDS and Behavior
Environmental
Public Health
Infectious Diseases
Social Psychology
Occupational Health
The Optimisation of Stochastic Grammars to Enable Cost-Effective Probabilistic Structural Testing
