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Publications by Kunttal Keyshar

Layer Dependence of the Electronic Band Alignment of Few-Layer MoS2 on SiO2 Measured Using Photoemission Electron Microscopy

Physical Review B
OpticalElectronicCondensed Matter PhysicsMagnetic Materials
2017English

Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

Microscopy and Microanalysis
Instrumentation
2017English

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