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Publications by Lingyun Ke
Heavy-Ion Induced Single Event Upsets in Advanced 65 Nm Radiation Hardened FPGAs
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Related publications
Investigation of Heavy-Ion Induced Single-Event Transient in 28 Nm Bulk Inverter Chain
Symmetry
Mathematics
Chemistry
Physics
Computer Science
Astronomy
Measurements and Simulations of Single-Event Upsets in a 28-Nm FPGA
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10T Subthreshold SRAM
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Heavy-Ion Broad-Beam and Microprobe Studies of Single-Event Upsets in 0.20-Μm SiGe Heterojunction Bipolar Transistors and Circuits
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Single Event Upsets Under 14-MeV Neutrons in a 28-Nm SRAM-based FPGA in Static Mode
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Radiation Hardness Evaluations of 65 Nm Fully Depleted Silicon on Insulator and Bulk Processes by Measuring Single Event Transient Pulse Widths and Single Event Upset Rates
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Single-Event Upsets in the Cluster and Double Star Digital Wave Processor Instruments
Space Weather
Atmospheric Science
Noise Impact of Single-Event Upsets on an FPGA-based Digital Filter
Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics
Aerospace
Aerospace Engineering
