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Publications by Lisa F. Edge
Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)
Advanced Materials Interfaces
Mechanics of Materials
Mechanical Engineering
Related publications
Modeling Mass Spectrometry Profiles in Atom Probe Tomography
New Applications in Atom Probe Tomography
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An Introduction to Atom Probe Tomography
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Atom Probe Tomography Characterization of Multilayer Films
Microscopy and Microanalysis
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Introduction: Special Issue on Atom Probe Tomography
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Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles
Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM
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Atom Probe Tomography: A Technique for Nanoscale Characterization
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Promoting Standards in Quantitative Atom Probe Tomography Analysis
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