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Publications by M. Avidano
Conduction Mechanisms and Charge Storage in Si-Nanocrystals Metal-Oxide-Semiconductor Memory Devices Studied With Conducting Atomic Force Microscopy
Journal of Applied Physics
Astronomy
Physics
Related publications
Study of Interface Charge Densities for ZrO2and HfO2Based Metal-Oxide-Semiconductor Devices
Advances in Materials Science and Engineering
Materials Science
Engineering
Charge Transport in Intermixed Regions of All-Polymer Solar Cells Studied by Conductive Atomic Force Microscopy
ACS Applied Materials & Interfaces
Medicine
Materials Science
Nanotechnology
Nanoscience
Comparative Investigation of Endurance and Bias Temperature Instability Characteristics in Metal-Al2O3-Nitride-Oxide-Semiconductor (MANOS) and Semiconductor-Oxide-Nitride-Oxide-Semiconductor (SONOS) Charge Trap Flash Memory
Journal of Semiconductor Technology and Science
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Interactive Force Between Cyclodextrin Inclusion Complexes Studied by Atomic Force Microscopy
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Engineering
Astronomy
Physics
Ultrahigh-Density Atomic Force Microscopy Data Storage With Erase Capability
Applied Physics Letters
Astronomy
Physics
Conducting Atomic Force Microscopy Study of Phase Transformation in Silicon Nanoindentation
Journal of Applied Physics
Astronomy
Physics
Spatial and Electronic Manipulation of Silicon Nanocrystals by Atomic Force Microscopy
Editorial: Metal and Semiconductor Nanocrystals
Frontiers in Chemistry
Chemistry
In-Situ Growth of MnAs Nanocrystals in Si Studied by Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
