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Publications by M. D. Boonzaayer

Use of Spectroscopic Ellipsometry for Feedback Control During the Growth of Thin AlAs Layers

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
1999English

Related publications

Studies of Thin Strained InAs, AlAs, and AlSb Layers by Spectroscopic Ellipsometry

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1996English

Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.

Hyomen Kagaku
1997English

Morphology and Spectroscopic Ellipsometry of PMMA Thin Films

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In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes

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Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry

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Improvement of Performance of InAs Quantum Dot Solar Cell by Inserting Thin AlAs Layers

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Fundamentals and Applications of Spectroscopic Ellipsometry

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Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry

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Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)

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