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Publications by M. Kogelschatz
Mean Time to Failure Distribution in Thin Oxide Film: Observation at Nano and Devices Scale and Modelling Using a Filamentary Growth Model
Related publications
Nucleation and Growth of Anodic Electrodeposited Cerium Oxide Thin Film
International Journal of Electrochemical Science
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Combinatorial Approach to Thin-Film Silicon Materials and Devices
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Thin Film Electroluminescent Devices.
SHINKU
Observation of Sn Thin Film Growth on Si(111) Surface Using Time of Flight Impact Collision Ion Scattering Spectroscopy.
SHINKU
Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.
Hyomen Kagaku
Challenging the Mean Time to Failure: Measuring Dependability as a Mean Failure Cost
Erratum To: Low Dielectric Transparent Poly(amide-Imide) Thin Film With Nano Scale Porous Structure
Macromolecular Research
Organic Chemistry
Polymers
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Dynamical Observation of the Thin Film Growth Processes Using Reflective High-Energy Electron Diffraction(RHEED).
Materia Japan
Fundamentals of Polycrystalline Thin Film Materials and Devices
