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Publications by M. P. Oxley
Atomic-Resolution EELS in Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
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The Ultimate Resolution in Aberration-Corrected STEM
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Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM
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Aberration Corrected STEM-EELS Study of the Hole Distribution in Cuprate Superconductors
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Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS
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High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM
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Aberration-Corrected STEM for Elemental Mapping
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Surface Channeling in Aberration-Corrected STEM of Nanostructures
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Understanding Catalyst Stability Through Aberration-Corrected STEM
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
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