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Publications by M.M.G. Barfels
A New High Stability, 4th Order Aberration Corrected Spectrometer and Imaging Filter for a Monochromated Tem
Microscopy and Microanalysis
Instrumentation
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On Proper Phase Contrast Imaging in Aberration Corrected TEM
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Performance and Stability of Dedicated Aberration-Corrected STEMs: A User's Perspective
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Understanding Catalyst Stability Through Aberration-Corrected STEM
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State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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