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Publications by Martin A. Crimp
Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction
Microscopy and Microanalysis
Instrumentation
Related publications
Observation of Substructure in Steels and Ni200 Using Electron-Channeling Contrast Imaging
Microscopy and Microanalysis
Instrumentation
Metallographic Preparation for Electron Backscattered Diffraction
Microscopy and Microanalysis
Instrumentation
Focused Ion Beam (FIB) Based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)
Microscopy and Microanalysis
Instrumentation
Multivariate Statistical Approaches for Electron Backscattered Diffraction
Microscopy and Microanalysis
Instrumentation
Selective Backscattered Electron Imaging of Material and Channeling Contrast in Microstructures of Scale on Low Carbon Steel Controlled by Accelerating Voltage and Take-Off Angle
ISIJ International
Mechanics of Materials
Alloys
Materials Chemistry
Metals
Mechanical Engineering
Mapping Anti-Phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction
Microscopy and Microanalysis
Instrumentation
Locating Atoms in Small Crystals by Combining Convergent Beam Electron Diffraction and Electron Channeling
Microscopy and Microanalysis
Instrumentation
Quantitative Chemical Phase Imaging Using Backscattered Electron Imagery, a New Approach
Microscopy and Microanalysis
Instrumentation
Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2
Microscopy and Microanalysis
Instrumentation
