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Publications by Morgann Berg
Layer Dependence of the Electronic Band Alignment of Few-Layer MoS2 on SiO2 Measured Using Photoemission Electron Microscopy
Physical Review B
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
Microscopy and Microanalysis
Instrumentation